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1st IEEE International Conference on Software Testing, Verification and Validation

4 juillet 2007

See also ; GEQseC : Model-Driven Engineering

ICST 2008


Sponsor : IEEE Computer Society Technical Committee on Software Engineering (TCSE)

April 9-11, 2008, Lillehammer, Norway

There has been very strong activity in the field of testing and validation research, as reflected in recent years by numerous workshops dealing with testing in different areas. The new IEEE International Conference on Software Testing Verification and Validation (ICST) will offer an open forum for software testing, verification and validation research and its transfer to practice. Among other things, it aims at stimulating scientific research on model-based software testing, domain specific testing, empirical studies of testing techniques, and the technology transfer of research results to software development practices.

We invite original, high-quality research papers and industrial experience papers in all areas of software testing, verification and validation.

Topics of interest include, but are not limited to :

- Software testing theory and practice
- Model-based testing
- Domain specific testing including, but not limited to, security testing, web services testing, database testing, and OO software testing
- Verification & Validation
- Quality Assurance
- Model checking
- Empirical studies
- Metrics
- Inspections
- Tools
- Testability and diagnosability
- Design for testability
- Testing education
- Testing in multidisciplinary applications
- Embedded software
- Technology transfer
- Model-Driven Engineering
- Novel approaches to software reliability assessment

- Conference Chair : Lionel Briand
- Program Chairs : Rob Hierons, Aditya Mathur
- Workshop Chair : Benoit Baudry
- Industry Chair : Per Runeson, Clay Williams

Important dates :

- Submission of abstracts : October 5, 2007
- Submission of full papers : October 12, 2007
- Notification : January 4, 2008
- Camera-ready : February 1, 2008

For ICST 2008 submission guidelines and all additional up to date information, please visit here.

Contact for more information.